Join us at Booth 522 in Manchester Central, United Kingdom, July 1 – 3, 2025
Learn MoreJoin us at Booth 1109 in Salt Lake City, Utah, July 27 - 31, 2025
Learn MoreThis application note demonstrates how to leverage FusionScope’s high-vacuum environment and precision tip placement to perform complementary SEM, AFM, and MFM analysis of magnetic micro- and nanostructures.
Learn MoreAddressing the challenges of capturing the intricate relationships between microstructure and material properties when processing and analyzing composite materials.
Learn MoreDiscover the FusionScope difference.
The only AFM that offers SEM Imaging, EDS Elemental Analysis, and Nanoprobing technology all within the same correlative microscopy platform!
Using Profile View, the AFM tip can be precisely positioned on the pore-like structures observed on the surface of metal films allowing for repeatable diameter and depth measurement of the same structure.
Elemental data overlayed onto AFM topographical information results in the identification of features difficult to observe visually, such as those in superconducting filaments.
Through precise navigation of nanoprobers and the AFM tip in Profile View, localized electrical information can be obtained of samples and devices under operation.
Perform a complete suite of characterization techniques ranging from high-resolution AFM and SEM imaging to analyzing topographical, nanomechanical, chemical, electrical, and magnetic properties with the power of correlative microscopy.
FusionScope gives you full freedom to accurately position your sample. With Profile View – an 80-degree tilt of the combined sample stage and AFM scan head – you can position the AFM tip quickly and precisely, even on complex and challenging sample surfaces.
FusionScope's custom software was specifically designed to make correlative microscopy easy and intuitive. Enjoy a user interface that provides automation for most routine functions within an intuitive and customizable user interface. Intelligent data handling organizes all your AFM and SEM data for easy access in the future.
Featuring an innovative shared coordinate system to automatically align AFM and SEM operations for measurements and sample positioning, within a single software interface you now can easily identify your area of interest, measure your sample, and combine your imaging data in real time.
